Variable thickness window: Thermal and structural analyses
نویسندگان
چکیده
منابع مشابه
Stress Analysis of Rotating Thick Truncated Conical Shells with Variable Thickness under Mechanical and Thermal Loads
In this paper, thermo-elastic analysis of a rotating thick truncated conical shell subjected to the temperature gradient, internal pressure and external pressure is presented. Given the existence of shear stress in the conical shell due to thickness change along the axial direction, the governing equations are obtained based on first-order shear deformation theory (FSDT). These equations are so...
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In this research, thermal buckling of thin rectangular plate made of Functionally Graded Materials (FGMs) with linear varying thickness is considered. Material properties are assumed to be graded in the thickness direction according to a simple power law distribution in terms of the volume fractions of the constituents. The supporting condition of all edges of such a plate is simply supported. ...
متن کاملstress analysis of rotating thick truncated conical shells with variable thickness under mechanical and thermal loads
in this paper, thermo-elastic analysis of a rotating thick truncated conical shell subjected to the temperature gradient, internal pressure and external pressure is presented. given the existence of shear stress in the conical shell due to thickness change along the axial direction, the governing equations are obtained based on first-order shear deformation theory (fsdt). these equations are so...
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In the present analysis, we study the boundary layer flow of an incompressible viscous fluid near the two-dimensional stagnation-point flow over a stretching surface. The effects of variable thickness and radiation are also taken into account and assumed that the sheet is non-flat. Using suitable transformations, the governing partial differential equations are first converted to ordin...
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In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 1995
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1145794